Presentation Profile
Routine Trace-Level Analysis of m-Xylene in High-Purity p-Xylene Using the Agilent 8890B GC System
Main Author
Scott Hoy - Agilent Technologies
Abstract:
As product purity increases, the concentrations of contaminants decrease until their respective signals cannot be distinguished from noise. Sustaining successful analysis in this region near the limits of detection and quantitation using gas chromatography requires controlling the factors that contribute to noise and variance. This presentation will show how to use the new Agilent 8890B GC to achieve single-digit ppm detection of m-xylene in high-purity p-xylene using FID, and how the features of the 8890B GC help the user maintain that performance. Two different method approaches will be explored; one method prioritizes instrument uptime by targeting maximum resolution, and the second method prioritizes speed at the cost of resolution for maximum throughput.
