2017 - Jay Sheffer
Applications Specialist – Ion Chromatography
Metrohm USA
After graduating with a BS degree in chemistry from Elon University in North Carolina in 1996, Jay attended graduate school at Emory University. There, he studied analytical chemistry with a research focus on MALDI-TOF mass spectrometry and received a master’s degree in 1998. Following school, Jay served for over 11 years as Senior Chemist for Constellation Technology Corp. in Largo, FL, with experience in GC-MS, ICP-MS, AA, HPLC, laser-ablation spectroscopy, and microscopy and managing multiple long-term research projects for the Department of Defense. In 2012, Jay begin work for Metrohm USA as an applications specialist with focus on ion chromatography and Combustion IC. He also serves on multiple committees with ASTM and is active in developing new analytical test methods for the petroleum and chemical markets.
Presentation(s):
New Approved Method for Measuring Halides and Sulfur in LPG Using Combustion IC – ASTM D7994-17
Abstract Number: 281
Friday, January 19th
11:00 AM - 11:30 AM
