2019 - Siqi Sun
Analytik Jena
Presentation(s):
Analysis of Trace Elements in Crude Oil by High Resolution Array ICP-OES based on ASTM D7691
Abstract Number: 219
Tuesday, October 15th
2:35 PM - 2:55 PM
Analytik Jena
Presentation(s):
Analysis of Trace Elements in Crude Oil by High Resolution Array ICP-OES based on ASTM D7691
Abstract Number: 219
Tuesday, October 15th
2:35 PM - 2:55 PM