Presentation Profile
Analysis of Elemental Impurities in Polymer Products by XRF
Currently Scheduled: 10/11/2023 - 8:30 AM - 8:55 AM
Room: Bluebonnet
Main Author
Daniel Pecard - Bruker AXS LLC
- Dr. Adrian Fiege - Bruker AXS GmbH
Abstract:
X-ray fluorescence (XRF) is a non-destructive analytical technique for the determination of additives and trace element contaminants in polymers. It helps improving polymer production processes, facilitates final product quality control, and ensures compliance with regulatory standards. This presentation will focus on the use of XRF for the analysis of elemental impurities. Such impurities can significantly affect the properties, performance, and toxicity of polymer products. Production residues that require monitoring down to the low-ppm level include Mg, Ti, Cr and several more. We will show typical use cases of Wavelength-Dispersive XRF and discuss when Energy Dispersive XRF can do the job.
