Presentation Profile
A New Generation of High-Resolution GC-MS with Automated Integrated Data Analysis
Currently Scheduled: 10/13/2021 - 8:25 AM - 8:55 AM
Room: Daffodil Room
Main Author
John Dane - JEOL USA, Inc.
Abstract:
In this presentation, a new, completely redesigned high-resolution time-of-flight mass spectrometer for GC-MS analysis will be discussed. More specifically, this new GC-MS system features increased resolving power (R > 30,000) and better mass accuracy (< 1ppm) while also offering a full complement of ionization techniques (Hard ionization: EI, Soft Ionization: CI, PI, FI). Additionally, the system is equipped with new data analysis software that uses high resolution MS in combination with EI and soft ionization methods to automatically identify analytes within complex mixtures. For this presentation we will show the effectiveness of combining this new high-performance GC-MS with our new automated qualitative analysis software.
