Presentation Profile
Increase Petroleum Lab Capabilities While Reducing Costs – Advantages of Using Enhanced Energy Dispersive XRF and Custom Standards.
Currently Scheduled: 10/16/2019 - 9:15 AM - 9:45 AM
Room: Wisteria Room
Main Author
Bryan DeVerse - Quantum Analytics
Abstract:
Visible defects in plastic can cause process delays which reduce efficiency in manufacturing processes. The first step to solving a defect issue, especially a defect caused by contamination, is identification of the contaminant. Only after identification can the root cause be found, leading to a successful solution. Infrared microscopy is an ideal tool for the identification of visible defects. Combining the chemical identification capabilities of infrared spectroscopy with a microscope’s ability to focus the analysis to a small area provides easy identification of many materials which cause visible defects. Unfortunately, infrared microscopes have traditionally been limited to central research labs due to their cost and complexity. A new class of infrared microscope accessories has recently changed this paradigm. Microscope accessories, such as the Czitek SurveyIR significantly reduce the initial cost and have ease of use features which allow them to be deployed into quality control and process laboratories. This presentation will detail the use and application of infrared microscope accessories for the analysis of visible contamination in plastics. Examples will be given showing several different contaminants and defects which can be identified including oxidation, slip agent aggregation and unintended particulates. Detail will be given as to the workflow and procedures needed to successfully identify contaminant samples including sample preparation, measurement and library searching. Finally, estimates of time and cost savings obtainable by moving these analyses from a central R&D facility or contract lab to an on-site laboratory will be presented.
