Presentation Profile

Analysis of Elemental Impurities in Naphtha by ICP-MS according to ASTM D8110-17

Currently Scheduled: 10/15/2019 - 2:55 PM - 3:15 PM
Room: South Lobby

Main Author
Oliver Buettel - Analytik Jena

Additional Authors
  • Dr. Rene Chemnitzer - Analytik Jena
Abstract Number: 220
Abstract:

Monitoring trace metal contents in naphtha is important for various reasons. In fuel production, the presence of metals such as calcium, magnesium, sodium, and potassium can form deposits and create wear on engine components. The presence of nickel can poison the expensive catalyst, while vanadium causes corrosion problems. During the refining process, the release of toxic metals into the environment has to be monitored and minimized since they are of environmental concern. Due to the typically very low element contents, ICP-MS is the method of choice. This work demonstrates the performance of the PlasmaQuant MS and its unmatched tolerance to organic solvents, which allow routine analysis of highly volatile samples according to ASTM D8110-17 with results exceeding the requirements for accuracy and plasma stability over time, and discusses the unique technologies enabling such performance.