Presentation Profile
High Temporal Resolution Mud-Gas Analysis Using SIFT-MS
Currently Scheduled: 1/18/2018 - 9:00 AM - 9:20 AM
Room: Exhibit Hall Classroom (End of 200 Aisle)
Main Author
Stephen Medlin - Quantum Analytics
- Vaughan Langford S. Ph.D. - Syft Technologies
- Barry J. Prince - Syft Technologies
- Daniel B. Milligan - Syft Technologies
- Murray J. McEwan - Syft Technologies
Abstract:
High-penetration-rate drilling technologies present a challenge to current mud-gas analysis techniques: they are limited in either analysis speed and/or the range of compounds measured. Selected ion flow tube mass spectrometry (SIFT-MS) is an analytical technique that detects and quantifies volatile organic compounds (VOCs) directly in air to part-per-trillion (ppt) concentrations within seconds. SIFT-MS uses multiple reagent ions to provide highly selective, quantitative analysis of wide range of hydrocarbons and other compounds of interest in this field. In this paper, we present data for C1 – C11 hydrocarbons that were acquired in a field test of SIFT-MS instrumentation for mud-tank headspace analysis.
