Presentation Profile
Moving the Analysis Closer to the Problem - Improving Efficiency in Plastics Manufacturing Through at Line Contaminant Identification
Currently Scheduled: 1/19/2018 - 11:00 AM - 11:25 AM
Room: Room 371 F
Main Author
Bryan DeVerse - Quantum Analytics
- John Seelenbinder - Czitek
Abstract:
This presentation will detail the use and application of affordable and easy to use infrared microscope accessories for the analysis of visible contamination in plastics. Examples will be given showing several different contaminants and defects which can be identified including oxidation, slip agent aggregation and unintended particulates. Detail will be given as to the workflow and procedures needed to successfully identify contaminant samples including sample preparation, measurement and library searching. Finally, estimates of time and cost savings obtainable by moving this analysis from a central R&D facility or contract lab to an on-site laboratory will be presented.
