Presentation Profile
Foreign Particle Analysis – Modern AI-Driven Solutions
Currently Scheduled: 10/16/2024 - 12:30 PM - 1:00 PM
Room: Hibiscus
Main Author
Nisarg Mistry - Houston MJ Associates
Abstract:
Foreign particle analysis (or contamination analysis) is a crucial part of any manufacturing
process – from polymers to batteries. This analysis plays an important role in understanding the
composition, origin, and potential impact of contaminants in various materials. This analysis has
historically been performed using the human brain and eyes (the world's most powerful computer and
camera combination). However, the classical manual techniques simply do not meet the ever-evolving
safety and quality regulations, as well as the industrial requirements for throughput in the modern age
of manufacturing. The current industry requirements dictate the need for foreign particle analysis to be
performed at high speeds, along with contamination characterization, classification, and sorting. This
lecture goes into modern methods for performing this analysis, the challenges that current optical and
illumination technology can create, how artificial intelligence is used to overcome these challenges, and
the future potential for this type of technology.
