Presentation Profile
Application Advantages of a HR-ARRAY ICP-OES for The Trace Analysis of Silicon in LIGHT Naphtha samples
Currently Scheduled: 10/12/2022 - 10:25 AM - 10:55 AM
Room: Wisteria
Main Author
Jessica Gantt - Analytik Jena
Abstract:
Silicon is known to affect the performance and reduce the lifetime of hydrotreatment catalysts. Monitoring potentially silicon impurities in incoming goods, process intermediates and final products is of great importance to refineries. Total silicon content can be measured directly by ICP-OES, but the direct analysis of organic matrices is still challenging for ICP techniques. In this study, we present the application advantages for trace analysis in light naphtha samples, originating from an ICP high-resolution (HR) optics, intelligent torch design and high plasma robustness. Additionally, the benefits powerful software tools for background correction and spectral interferences are demonstrated.
